Spectral Analysis Of High Carbon Silicon

Spectral analysis is a method of detection by measuring the spectral characteristics of high carbon silicon samples. Among them, infrared spectroscopy and Raman spectroscopy are commonly used spectral analysis methods.

Infrared spectrum By measuring the absorption lines of high carbon silicon samples in the infrared band to determine their chemical composition, and thus indirectly infer its carbon content.

Raman spectroscopy is to obtain the structure information of high carbon silicon sample by measuring the scattering spectrum under laser irradiation, and then deduce the carbon content in the sample.