Physical Analysis Method Of High Carbon Silicon

Physical analysis method

The physical analysis method mainly detects high carbon silicon samples by measuring their physical properties. For example, the relevant physical parameters of high carbon silicon samples can be obtained by density measurement, thermal conductivity measurement, and electrical conductivity measurement, and then the carbon content in high carbon silicon can be determined by comparing with the standard value. This method is simple to operate, the results are accurate and reliable, and it is widely used in industrial production.